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Session Details International Applied Reliability Symposium

Session ID:
T1-S9

Date and Time:
8:45 to 10:00 am, Friday June 18, 2004

Presentation Title:

Reliability Measurement in the Tape Drive and Related Electronics Industries

Overview and 
     Purpose:

 

Data back-up and recovery has become a multi-billion dollar a year industry where reliability metrics are crucial to customer acceptance of products. Examples of current methods and trends within the tape drive industry are presented and discussed.

This presentation will describe actual practices and future directions for reliability measurement and specification within the tape drive industry. Three examples will be presented: customer return rate, reliability demonstration testing and media durability testing.  

 

Author/ Presenter:

Paul Jaramillo
Quantum Corporation

Quantum

Keywords:

 

Reliability Measurement, Reliability Specification, MTBF, MTTF

 

 

 

 


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