Presentation Title:

Overview and 
     Purpose:

This presentation will discuss various methodologies of reliability demonstration techniques with emphasis on "Test to a Bogey," often referred to as "Success Run Testing." During the product development cycle, many industries utilize a testing of N test samples with the goal of observing N successes or other reliability demonstration techniques. However, the overall approach of using reliability demonstration as a primary metric for expected life in the field is sometimes misapplied, often leading to unreasonable expectations and conclusions. The presentation addresses such questions as: What are the appropriate and inappropriate applications of reliability demonstration tools? What do the reliability numbers actually mean?

Author/ Presenter:

Keywords:

Reliability Demonstration, Success Run, Test to a Bogey