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Track 1 Session 2
10:20 to 11:30 a.m. Wednesday
June 14, 2006
Injecting Field Effects Into Reliability
Predictions
One of the worst things a company
can do with its customers is to over-promise and under-deliver. No
more is this true than when it comes to reliability. The
architecture of design and in-house test data are just stepping
stones to accurate predictions about a new products’ reliability and
Annual Failure Rate (AFR). Noises in the field, e.g.
different usage profiles, environment, must also be considered. We
have improved the prediction methodology by appraising the effects
of the field noises. Beyond giving customers and developers a more
accurate understanding of a product’s reliability, this methodology
also allows for proper preparation of field service, and optimizes
failure analysis and corrective action resources. This presentation
analyzes the product’s field performance, quantifies the magnitude
of field effects, and injects field effects into the reliability
prediction.
Key Words: Reliability Life
Data Analysis, System Modeling, Reliability Growth Model, Early Life
Failure, Warranty Analysis
Wei Zhang, Douglas M. Garcia and Daniel
B. Rose
Sun Microsystems
Louisville, Colorado |
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