Reliability and Maintainability Symposium: ARS, North America North America

Track 1 Session 2
10:20 to 11:30 a.m. Wednesday June 14, 2006

Injecting Field Effects Into Reliability Predictions

One of the worst things a company can do with its customers is to over-promise and under-deliver. No more is this true than when it comes to reliability. The architecture of design and in-house test data are just stepping stones to accurate predictions about a new products reliability and Annual Failure Rate (AFR). Noises in the field, e.g. different usage profiles, environment, must also be considered. We have improved the prediction methodology by appraising the effects of the field noises. Beyond giving customers and developers a more accurate understanding of a products reliability, this methodology also allows for proper preparation of field service, and optimizes failure analysis and corrective action resources. This presentation analyzes the products field performance, quantifies the magnitude of field effects, and injects field effects into the reliability prediction.

Key Words: Reliability Life Data Analysis, System Modeling, Reliability Growth Model, Early Life Failure, Warranty Analysis

Wei Zhang, Douglas M. Garcia and Daniel B. Rose
Sun Microsystems
Louisville, Colorado

Sun Microsystems

 

 

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