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Track 2 Session 6
10:20 to 11:30 a.m. Thursday
June 15, 2006
A Process to Accelerate Reliability
Growth Testing that Provides Demonstrated Reliability With
Statistical Confidence
This session presents a process for
accelerating reliability growth testing (RGT) that demonstrates an
achieved level of reliability with statistical confidence. This
process combines the best features of Highly Accelerated Life
Testing (HALT) with the Army Materiel Systems Analysis Activity
(AMSAA) Reliability Growth-Tracking Model. Upper and lower operating
limits for environmental stressors that are identified by HALT are
used to run RGT under maximum allowed accelerated conditions.
Times-to-failure (TTF) are then translated from accelerated time to
normal-use-time or non-accelerated time with the use of
scientifically accepted acceleration factors or functions. Elapsed
test time is reduced while retaining a statistically significant
demonstration of achieved reliability at confidence. The magnitude
of the reduction in elapsed time depends on the failure mechanism
having the lowest acceleration factor.
Key Words: Accelerated Test,
Reliability Growth, Demonstration Testing
David C.
Steiner, Timothy G. Ryan and Micah S. Koons
Raytheon
McKinney, Texas |
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