International Applied Reliability Symposium
 

2008

North America 2008
Event Program
     -Brochure (*.pdf)
Golf Outing
Venue and Hotel
Register
Info for Presenters

Archive

Past Symposia
Photo Albums
Order Proceedings
Offer Feedback

Contact

1.888.886.0410
(in U.S. and Canada)
 or
 +1.520.886.0410
Info@ARSymposium.org
Send Link... E-mail Link to a Friend

Worldwide

North America
South America
Asia Pacific
Europe
India

Track 2 Session 6
10:20 to 11:30 a.m. Thursday June 15, 2006

A Process to Accelerate Reliability Growth Testing that Provides Demonstrated Reliability With Statistical Confidence

This session presents a process for accelerating reliability growth testing (RGT) that demonstrates an achieved level of reliability with statistical confidence. This process combines the best features of Highly Accelerated Life Testing (HALT) with the Army Materiel Systems Analysis Activity (AMSAA) Reliability Growth-Tracking Model. Upper and lower operating limits for environmental stressors that are identified by HALT are used to run RGT under maximum allowed accelerated conditions. Times-to-failure (TTF) are then translated from accelerated time to normal-use-time or non-accelerated time with the use of scientifically accepted acceleration factors or functions. Elapsed test time is reduced while retaining a statistically significant demonstration of achieved reliability at confidence. The magnitude of the reduction in elapsed time depends on the failure mechanism having the lowest acceleration factor.

Key Words: Accelerated Test, Reliability Growth, Demonstration Testing

David C. Steiner, Timothy G. Ryan and Micah S. Koons
Raytheon
McKinney, Texas

Raytheon

 

 

Organized by ReliaSoft Corporation and the System Reliability Center (SRC)

The ARSymposium Web site is sponsored and maintained by ReliaSoft Corporation.
Copyright ©2003-2008 ARS, All Rights Reserved. Contact
Webmaster.

PRIVACY POLICY
Questions +1.520.886.0410