Track 1 Session 7
1:00 to 2:00 p.m. Wednesday June 18, 2008

Customer Focused Methodologies for Reliability Testing, Modeling, and Failure Analysis in the Semiconductor Laser Diode Industry

An integrated reliability program is a key part of product development. This presentation illustrates the advantages of reliability analysis and modeling (using ALTA and Weibull++) at various stages of product development along with customer communication to enable the measurement and improvement of product reliability in a semiconductor diode laser product. The following topics are highlighted: 1) Reliability activity during the "concept stage" of a new product development. 2) Pre-qualification and Design for Reliability during product development. 3) Ongoing reliability monitoring during manufacturing and product release. 4) A "Failure Analysis System" driving internal and external process improvement to deliver customer satisfaction.