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Track 1 Session 7
1:00 to 2:00 p.m. Wednesday June 18, 2008
Customer Focused Methodologies for
Reliability Testing, Modeling, and Failure Analysis in the
Semiconductor Laser Diode Industry
An integrated reliability program
is a key part of product development.
This presentation illustrates the advantages of reliability analysis
and modeling (using ALTA and Weibull++) at various stages of product
development along with customer communication to enable the
measurement and improvement of product reliability in a
semiconductor diode laser product. The following topics are
highlighted: 1) Reliability activity during the "concept stage" of a
new product development. 2) Pre-qualification and Design for
Reliability during product development. 3) Ongoing reliability
monitoring during manufacturing and product release. 4) A
"Failure Analysis System" driving internal and external process
improvement to deliver customer satisfaction.
Key Words: Reliability
Testing, Reliability Modeling, Customer Communication, Failure
Analysis System, Concept Stage, New Product Development, Reliability
Presentation, Customer Focused Methodologies
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