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Track 3 Session 1
9:10 to 10:10 a.m. Tuesday June 9, 2009
Complex System Reliability with Imperfect Fault
Coverage
Redundant systems must include some means by which the
system detects, isolates and reconfigures in a manner that maintains system performance in
the event of failures among its redundant components; this process is called
"redundancy management" (RM). The probability that the RM process is accomplished
without error is called "fault coverage" or "coverage." Coverage for
complex redundant systems is seldom, and perhaps never, perfect. A system with less than
perfect coverage is said to be subject to "imperfect fault coverage" (IFC). Since
coverage levels even slightly less than unity will have a significant impact on system
reliability, it is critical to correctly model the effects of IFC on redundant system
reliability. The correct reliability modeling for redundant systems depends on the nature of
the system’s RM process: if each redundant component has an associated coverage value
for each of its redundant components, the appropriate model is Element Level Coverage
(ELC); if, however, system RM uses a voting process, such as mid-value-select, then the
appropriate model is Fault Level Coverage (FLC). In this presentation, mathematical models
for determining IFC reliability for both ELC and FLC systems will be discussed; firstly for
k-out-of-n:G systems, and, secondly, for a complex multi-channel digital fly-by-wire
system. These examples will clearly illustrate the significant effects of imperfect fault
coverage on redundant system reliability.
Key Words: Imperfect Fault
Coverage, k-out-of-n:G System Reliability, Reliability of Systems
Subject to Imperfect Fault Coverage
Albert
Myers
Myers Consulting
La Habra Heights, California
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