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Track 3 Session 2
10:30 to 11:30 a.m. Tuesday
June 9, 2009
Successful Application of Reliability
Centered Maintenance to Semiconductor Equipment
To achieve precise nano-scale geometric structure on
wafers, it is very important to maintain semiconductor manufacturing equipment smartly.
Currently, there are three maintenance strategies: 1) run to failure or breakdown
maintenance, 2) time-based maintenance, or 3) usage-based maintenance. The most often
used strategies are time-based maintenance and usage-based maintenance for the equipment
that cannot afford the run-to-failure cost. The problems with a time-based or
usage-based maintenance strategy are that we waste a lot of good material when parts are
still in good condition and also we may run into equipment breakdown if the equipment
parts fail before the pre-defined maintenance time. Either case will yield unnecessary
product cost. So we proposed to apply a reliability centered maintenance approach to the
management of our equipment maintenance plan. With several key aspects and key
statistical techniques, we successfully applied the reliability centered maintenance
approach to semiconductor equipment and saved costs in the manufacturing line.
Key Words: Reliability,
Maintenance, Quality, Equipment Assessment
John Mao and
Ambika Balasubramaniyan
Intel Corporation
Santa Clara, California
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