Green Room - Session 2
1:00 to 2:00 p.m. Tuesday, June 13, 2017
Life Test Correlation Using Simulated Aided/Simulation Guided Testing Methods
There are many standards and approaches for accelerated durability-reliability testing of electrical/electronic equipment. Determining how long to run an accelerated life test, under specific stress levels, to simulate the expected usage life of a product is a challenge. The classical way to determine the duration of a life test is a long and expensive process of physical evaluations to correlate test to field conditions.
A better, science-based approach is now possible by using Physics of Failure math models of aging-wear out mechanisms of E/E components and materials, based on the material science principles of Stress-Driven Damage Accumulation. These models can be used in a Computer Aided Engineering (CAE) durability-reliability simulation to determine the rate and accumulated amounts of damage that correlates to when the failure point of an E/E device is reached.
This process to correlate durability test results to field conditions is known as Simulation Aided Testing (SAT). The inverse process where a PoF durability simulation of field conditions is used to design an accelerated life test is known as Simulated Guided Testing (SGT). This presentation will provide an overview of SAT/SGT methods with examples for optimizing accelerated thermal cycling life testing of electronic products.
Key Words: Accelerated Life Testing (ALT), Physics of Failure (PoF), Simulation Aided Testing (SAT), Simulated Guided Testing (SGT), Computer Aided Engineering (CAE), Durability Simulation, Test to Field Correlation
Rochester Hills, Michigan