North America

Green Room - Session 2

1:00 to 2:00 p.m. Tuesday, June 13, 2017

Life Test Correlation Using Simulated Aided/Simulation Guided Testing Methods

There are many standards and approaches for accelerated durability-reliability testing of electrical/electronic equipment. Determining how long to run an accelerated life test, under specific stress levels, to simulate the expected usage life of a product is a challenge. The classical way to determine the duration of a life test is a long and expensive process of physical evaluations to correlate test to field conditions.

A better, science-based approach is now possible by using Physics of Failure math models of aging-wear out mechanisms of E/E components and materials, based on the material science principles of Stress-Driven Damage Accumulation. These models can be used in a Computer Aided Engineering (CAE) durability-reliability simulation to determine the rate and accumulated amounts of damage that correlates to when the failure point of an E/E device is reached.

This process to correlate durability test results to field conditions is known as Simulation Aided Testing (SAT). The inverse process where a PoF durability simulation of field conditions is used to design an accelerated life test is known as Simulated Guided Testing (SGT). This presentation will provide an overview of SAT/SGT methods with examples for optimizing accelerated thermal cycling life testing of electronic products.

Key Words: Accelerated Life Testing (ALT), Physics of Failure (PoF), Simulation Aided Testing (SAT), Simulated Guided Testing (SGT), Computer Aided Engineering (CAE), Durability Simulation, Test to Field Correlation

James McLeish

DfR Solutions

Rochester Hills, Michigan