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Session 10 Example of a Thermal Cycle Accelerated Life Test on a Consumer Electronic Component This presentation will demonstrate the concept of accelerated life testing based on field application data so as to reduce the release test time and cost. The concept is based on accelerated life test data modeling to provide an early indication on what type of failure mode would occur during the warranty period. When accelerated life testing is conducted, the common acceleration mode is voltage, temperature or humidity. This example will present an accelerated life test model subjected to thermal cycles (high and low temperature switching). We shall demonstrate the reliability technique, data analysis and methods used to determine the acceleration factor. The empirical findings and benefits resulting from the example will be shared.
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