International Applied Reliability Symposium
 

Track 1 Session 10
2:00 to 3:10 p.m. Thursday September 14, 2006

A Quantitative Approach to Reliability Risk Assessment for Customer Return Issues

This presentation discusses how to address specific questions asked by customers about the reliability of semiconductor and electronic products with return issues. This is one of the biggest challenges faced by the industry today. Here are some of the questions:

1. What is the reliability of the affected parts that are currently in the field?
2. How many parts am I going to expect to fail for the next few months?
3. Do I need to recall all my products or not?

Find out how the quantitative analysis can address these very important questions.


 
Ariel Navaja
ReliaSoft Asia, Singapore

 

Ariel Navaja is a reliability consultant and instructor in the areas of FMEA, life data analysis and other reliability engineering disciplines. Over the past four years, Mr. Navaja has been championing and enabling the use of proper reliability and FMEA practices in the Asia Pacific region. Before joining ReliaSoft, Mr. Navaja worked at Analog Devices as a Process Engineer and subsequently as a Reliability Engineer. He holds a Bachelor of Science degree in Metallurgical Engineering from the University of the Philippines.

 

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