International Applied Reliability Symposium (ARS): An international reliability and maintainability conference event

Track 1 Session 7
8:30 to 9:40 a.m. Thursday September 14, 2006

Statistical Modeling of Semiconductor Products and Processes Using System Reliability Concept

This presentation demonstrates the procedure for building an appropriate life distribution model that represents the times-to-failure (reliability) of the entire system based on the life distributions of the process and/or sub-processes from which it is composed. As the key input, failure modes along with all known root causes are elaborately identified from each process step and are translated into a reliability block diagram (RBD) model for the entire product and process. The presentation also discusses how the RBDs are made useful in evaluating product and process performance, which can then be applied universally to all semiconductor package types.

 
Peter Tecson Awayan
A! Quality, Philippines

 
Peter Awayan is a full-time consultant principally engaged in the semiconductor and electronics industries in the Philippines. He has been a resident consultant of Amkor Technology Philippines for the past two years. He is also a project consultant of the Advanced Research & Competency Development Institute (ARCDI), the research and training center of the semiconductor and electronics industries in the Philippines. He is an expert in Six Sigma tools and methodologies and has been providing consultancy services to other leading corporations in the Philippines, including Texas Instruments, AMI Semiconductors, Sanyo Semiconductors, Toshiba Information Equipment, Samsung, among others. Before engaging in private consultancy work, he last worked as Quality Assurance Manager of ATMEL (TSPIC). Mr. Awayan is a candidate for Master of Statistics at the University of the Philippines in Diliman.