In the DOE stage, not only the important design factors but also the important stress factors that affect the product reliability (such as temperature, voltage or humidity) also can be identified. These important stress factors will be used in accelerated life tests. Once the design is fixed by adjusting the design factors, accelerated life testing can be used to estimate the product reliability in the field.

In this presentation, we will show how to use fractional factor design to identify important design and stress factors. We also will present how to use accelerated life testing to predict field reliability.

 

Harry Guo and Hongan Lin ReliaSoft Corporation and ReliaSoft Asia Tucson, Arizona and Singapore

Dr. Huairui Guo is the Director of Theoretical Development at ReliaSoft Corporation. He received his Ph.D (2004) in Systems and Industrial Engineering from the University of Arizona. He also received his B.S (1997) in Mechanical Engineering from the Xi’an Jiaotong University, M.E. (2000) in Mechanical Engineering from the Huazhong University of Science and Technology in China, M.E. in Manufacturing (2002) from the National University of Singapore and M.S. (2004) in Reliability and Quality Engineering from the University of Arizona. He has published papers in the areas of Quality Engineering including SPC, ANOVA and DOE and Reliability Engineering. His current research interests include Repairable System Modeling, Accelerated Life/Degradation Testing, Warranty Data Analysis and Robust Design. Recently, Dr. Guo received the Best Paper Award of Quality Control and Reliability at the Industrial Engineering Conference in Nashville, Tennessee, May 19 - 23, 2007.