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Track 1 Session 2
10:30 to 11:30 a.m. Wednesday March 26, 2008
Highly Accelerated Tests and Burn-in: Applications, Success Stories, Limits and Guidelines for New
Products
This presentation describes the
introduction of HAT (Highly Accelerated “Life” Tests) and HASS
(Highly Accelerated Stress Screening) burn-in at Trixell in order to
diminish early failure rate. First, HAT has been performed on
complete products. More than knowing the weakest points of our
products, the aim was to evaluate the interest and pertinence of a
HASS burn-in on Trixell detectors. Some similarities have been found
between failures that appeared during the HAT tests and those
compiled in the after-sales database. Then Trixell decided to apply
a new burn-in based on HAT results. The environmental conditions, proof
of screen and efficiency process will be detailed in the
presentation. With the good results, we decided to apply HASS
burn-in in our detector production step.
Today, the new Trixell detectors will pass through HASS burn-in. The
complexity of our products and competition of the market oblige us
to reduce early failures to a minimum. Therefore, Trixell is widely
using HAT tests as soon as possible in the product conception step
to be able to:
- Reveal the weakest points and perform some failure analysis with
developers to improve the product before fixing the design and
beginning the production.
- Perform an efficient HASS burn-in, in the right conditions, on the
first produced detectors.
Key Words: HALT, HAT,
HASS, Proof of Screen, Reliability Improvement
Eric Sicard
Trixell
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