Track 2 Session 9

8:00 to 9:00 a.m. Friday April 9, 2010

Time-to-Failure (TTF) Prediction Based on Software Testing Process Outcomes and Life Data Analysis

The presentation shows how to include ReliaSoft tools in software developing and testing processes concerning embedded software/hardware electronic devices. In many electronic devices, the reliability is determined not only by hardware, but also by software, which is one of the key factors. In the past there was a focus on hardware, so this presentation proposes how to try to merge together the two domains. Time-to-failure (TTF) is a factor derived from hardware investigation and reliability tests. Software development processes nowadays use iterative approaches, such as Rational Unified Process (RUP), Agile and other methods. The tests always end with each iteration. The outcome of the tests can be derived by using life data analysis correlation between TTF and the software. Based on this correlation, if it appears at all, there is a possibility of predicting how long it will take to develop the software and reach the predicted TTF for the current device. It is necessary to remember that such a correlation can be used only as a suggested estimation for project owners.

Key Words: Life Data Analysis, Time to Failure, Testing, Estimation, Correlation, Weibull

Krzysztof Senczyna

Tieto

Poland