|
|
| Detalhes
das Apresentações - SIC
2005 |
|
|
|
Dia e Hora:
14:00 às 15:00, Quinta-Feira 16 de
Junho, 2005 - Sala 1 +
Sala 2 |
|
Título da Apresentação: |
Making Combining Life Data
Analysis, Warranty Data and Quality Methods |
Descrição: |
One can prepare
forecasts of expected warranty returns for a future period based on a
life data analysis model. These forecasts can then, in turn, be compared
with actual returns observed in that period. A set of tools from
statistical process control can be used to determine if a period and lot
combination indicates an isolated departure from the life data model or,
more importantly, if there is evidence of a persistent model departure.
A persistent model departure can indicate a bad lot or an incorrect life
data model, usually due to emerging failure modes previously masked in
the censored observations.
This tutorial will illustrate the concepts with an example, using the
Weibull++ life data analysis software and some Visual Basic macros in
Excel.
|
Autor(es)/
Empresa: |
Dave Olwell
Naval Postgraduate School |
|
|